Selenium ruby glass: Preparation and x-ray study

被引：0
|
作者：
Bigelow, Maurice H.
Silverman, Alexander
机构：
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1933年 / 16卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：214 / 219
页数：6
相关论文
共 50 条
  • [21] HYDROTHERMAL RUBY - INFRARED SPECTRA AND X-RAY TOPOGRAPHY
    BELT, RF
    JOURNAL OF APPLIED PHYSICS, 1967, 38 (06) : 2688 - &
  • [22] AN X-RAY DIFFRACTION STUDY OF STRUCTURE OF SILICA GLASS
    CARTZ, L
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1964, 120 (4-5): : 241 - &
  • [23] X-RAY DIFFUSE SCATTERING STUDY OF STRUCTURE OF GLASS
    TOMOZAWA, M
    AMERICAN CERAMIC SOCIETY BULLETIN, 1971, 50 (09): : 767 - &
  • [24] X-ray photoelectron study of lanthanide borosilicate glass
    Maslakov, K. I.
    Stefanovsky, S. V.
    Teterin, A. Yu.
    Teterin, Yu. A.
    Marra, J. C.
    GLASS PHYSICS AND CHEMISTRY, 2009, 35 (01) : 21 - 27
  • [25] X-ray photoelectron study of lanthanide borosilicate glass
    K. I. Maslakov
    S. V. Stefanovsky
    A. Yu. Teterin
    Yu. A. Teterin
    J. C. Marra
    Glass Physics and Chemistry, 2009, 35 : 21 - 27
  • [26] X-ray study of potash-silica glass
    Biscoe, J
    Druesne, MAA
    Warren, BE
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1941, 24 (03) : 100 - 102
  • [27] X-RAY STUDY OF POLYTETRAFLUOROETHYLENE GLASS-TRANSITION
    TSVANKIN, DJ
    ZHUKOV, VP
    DEDOVIK, AM
    GENIN, JV
    LEVIN, VI
    PAPKOV, VS
    DOKLADY AKADEMII NAUK SSSR, 1987, 297 (04): : 906 - 908
  • [28] INFLUENCE OF SURFACE PREPARATION ON SMALL ANGLE X-RAY SCATTERING BY GLASS
    WILLIAMS, JA
    RINDONE, GE
    MCKINSTR.HA
    AMERICAN CERAMIC SOCIETY BULLETIN, 1969, 48 (04): : 442 - +
  • [29] X-RAY PHOTOEMISSION-STUDY OF ORTHORHOMBIC SELENIUM - A NEW ALLOTROPE OF CRYSTALLINE SELENIUM
    TAKAHASHI, T
    YAGI, S
    SAGAWA, T
    NAGATA, K
    MIYAMOTO, Y
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1985, 54 (03) : 1018 - 1022
  • [30] Glass Monocapillary X-ray Optics And Their Applications In X-ray Microscopy
    Zeng, X.
    Feser, M.
    Huang, E.
    Lyon, A.
    Yun, W.
    X-RAY OPTICS AND MICROANALYSIS, PROCEEDINGS, 2010, 1221 : 41 - 47
12345