OPERATOR BEHAVIORAL BIASES USING HIGH-RESOLUTION TOUCH INPUT DEVICES

被引：0
|
作者：
BERINGER, DB
BOWMAN, MJ
机构：
来源：
PROCEEDINGS OF THE HUMAN FACTORS SOCIETY 33RD ANNUAL MEETING, VOL 1: PERSPECTIVES | 1989年
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：320 / 324
页数：5
相关论文
共 50 条
  • [41] High-resolution spatial light modulation with distributed photorefractive devices
    Canoglu, E
    Tayebati, P
    Hantzis, C
    Jehanno, A
    Sacks, RN
    IEEE PHOTONICS TECHNOLOGY LETTERS, 1998, 10 (02) : 221 - 223
  • [42] High-resolution light-emitting devices for display applications
    Zheng, Yueting
    Yu, Yongshen
    Chen, Wei
    Hu, Hailong
    Guo, Tailiang
    Li, Fushan
    SCIENCE CHINA-MATERIALS, 2023, 66 (06) : 2128 - 2145
  • [43] Active touch sensing by multi-axial force measurement using high-resolution tactile sensor with microcantilevers
    Yokoyama, Hokuto
    Kanashima, Takeshi
    Okuyama, Masanori
    Abe, Takashi
    Noma, Haruo
    Azuma, Teruaki
    Sohgawa, Masayuki
    IEEJ Transactions on Sensors and Micromachines, 2014, 134 (03) : 58 - 63
  • [44] High-resolution simulations of nonlinear electromagnetic turbulence in tokamak devices
    Liu, Yanjun
    Liu, Zixi
    Liu, Jian
    Gao, Baofeng
    Zhang, Wei
    Xia, Tianyang
    Liu, Haiqing
    Zhuang, Ge
    Gao, Xiang
    EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 2025,
  • [45] Panning and Zooming High-Resolution Panoramas in Virtual Reality Devices
    Chang, Huiwen
    Cohen, Michael F.
    UIST'17: PROCEEDINGS OF THE 30TH ANNUAL ACM SYMPOSIUM ON USER INTERFACE SOFTWARE AND TECHNOLOGY, 2017, : 279 - 288
  • [46] High-resolution image reconstruction for portable ultrasound imaging devices
    Wang, Ruoyao
    Fang, Zhenghan
    Gu, Jiaqi
    Guo, Yi
    Zhou, Shicong
    Wang, Yuanyuan
    Chang, Cai
    Yu, Jinhua
    EURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSING, 2019, 2019 (01)
  • [47] High-resolution spatial light modulation with distributed photorefractive devices
    CoreTek, Inc, Burlington, United States
    IEEE Photonics Technol Lett, 2 (221-223):
  • [48] HIGH-RESOLUTION SYSTEM FOR PHOTORESPONSE MAPPING OF SEMICONDUCTOR-DEVICES
    KASPRZAK, LA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (03): : 257 - 262
  • [49] SPECIAL ISSUE ON HIGH-RESOLUTION FABRICATION OF ELECTRON DEVICES - FORWORD
    PEASE, RFW
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (11) : 1267 - 1267
  • [50] High-resolution current and temperature mapping of electronic devices using scanning Joule expansion microscopy
    Varesi, J
    Muenster, S
    Majumdar, A
    1998 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 36TH ANNUAL, 1998, : 169 - 172
12345