COMBINED FIELD-ION AND SCANNING TUNNELING MICROSCOPE

被引：1

作者：

SAKURAI, T ^{[1
]}

HASHIZUME, T ^{[1
]}

KAMIYA, I ^{[1
]}

HASEGAWA, Y ^{[1
]}

SAKAI, A ^{[1
]}

KOBAYASHI, A ^{[1
]}

MATSUI, J ^{[1
]}

TAKAHASHI, S ^{[1
]}

KONO, E ^{[1
]}

WATANABE, H ^{[1
]}

机构：

[1] NEC CORP,MIYAMAE KU,KAWASAKI,KANAGAWA 213,JAPAN

来源：

JOURNAL DE PHYSIQUE | 1987年 / 48卷 / C-6期

关键词：

D O I：

10.1051/jphyscol:1987613

中图分类号：

学科分类号：

摘要：

引用

页码：79 / 84

页数：6

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