COMBINED FIELD-ION AND SCANNING TUNNELING MICROSCOPE

被引：1
|
作者：
SAKURAI, T [1 ]
HASHIZUME, T [1 ]
KAMIYA, I [1 ]
HASEGAWA, Y [1 ]
SAKAI, A [1 ]
KOBAYASHI, A [1 ]
MATSUI, J [1 ]
TAKAHASHI, S [1 ]
KONO, E [1 ]
WATANABE, H [1 ]
机构：
[1] NEC CORP,MIYAMAE KU,KAWASAKI,KANAGAWA 213,JAPAN
来源：
JOURNAL DE PHYSIQUE | 1987年 / 48卷 / C-6期
关键词：
D O I：
10.1051/jphyscol:1987613
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：79 / 84
页数：6
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