An analysis of scattered x-rays with the double crystal spectrometer

被引：14

作者：

Gingrich, NS ^{[1
]}

机构：

[1] Univ Chicago, Ryerson Phys Lab, Chicago, IL USA

来源：

PHYSICAL REVIEW | 1930年 / 36卷 / 06期

关键词：

D O I：

10.1103/PhysRev.36.1050

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1050 / 1059

页数：10

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