An analysis of scattered x-rays with the double crystal spectrometer

被引：14
|
作者：
Gingrich, NS [1 ]
机构：
[1] Univ Chicago, Ryerson Phys Lab, Chicago, IL USA
来源：
PHYSICAL REVIEW | 1930年 / 36卷 / 06期
关键词：
D O I：
10.1103/PhysRev.36.1050
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1050 / 1059
页数：10
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