ELECTRON-DIFFRACTION DETERMINATION OF STRUCTURE OF THIN-FILMS INTLS2

被引：0

作者：

AGAEV, KA ^{[1
]}

GASYMOV, VA ^{[1
]}

CHIRAGOV, MI ^{[1
]}

机构：

[1] ACAD SCI AZSSR,INORG & PHYS CHEM INST,BAKU,AZSSR

来源：

KRISTALLOGRAFIYA | 1973年 / 18卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：366 / 368

页数：3

共 50 条

[41] THE USE OF ELECTRON-DIFFRACTION INTENSITIES IN STRUCTURE DETERMINATION
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