POLYIMIDE ON SILICON X-RAY MASK SUBSTRATES

被引:0
|
作者
FEDER, R [1 ]
HOFER, D [1 ]
ROMANKIW, L [1 ]
WARDLY, G [1 ]
CASTELLANI, E [1 ]
SCOTT, R [1 ]
TOPALIAN, J [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
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中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:C148 / C148
页数:1
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