Polarized Light Scattering Spectroscopy for Particle Size Measurement on Surface

被引：0

作者：

Cho, HyoungJun ^{[1
]}

Choi, ChiKyu ^{[1
]}

Kim, DooChul ^{[1
]}

Yu, YoungHun ^{[1
]}

机构：

[1] Jeju Natl Univ, Basic Res Inst, Dept Phys, Jeju City 690756, South Korea

来源：

KOREAN JOURNAL OF OPTICS AND PHOTONICS | 2005年 / 16卷 / 06期

关键词：

Scattering measurements; Mie theory; Spectroscopy surface;

D O I：

10.3807/KJOP.2005.16.6.560

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We used the polarized light scattering spectroscopy(PLSS) to get selectively the particle size information on a surface in optically diffuse material, and we analyzed the experimental results by Mie scattering theory. We found that the PLSS was the proper method for getting the surface information in optically diffuse material. This method is able to be used in biotechnology area for diagnostics.

引用

页码：560 / 564

页数：5

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