LARGE-SIGNAL ANALYSIS OF THE EXTENDED INTERACTION OSCILLATOR

被引：0
|
作者：
FANG, Y [1 ]
ZHANG, Y [1 ]
YOU, Y [1 ]
机构：
[1] ACAD SINICA,INST COMP TECHNOL,PEKING,PEOPLES R CHINA
来源：
SCIENTIA SINICA | 1979年 / 22卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：405 / 416
页数：12
相关论文
共 50 条
  • [21] APPROXIMATE LARGE-SIGNAL ANALYSIS OF IMPATT OSCILLATORS
    BLUE, JL
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (02) : 235 - &
  • [22] Analysis and prediction of loudspeaker large-signal symptoms
    Wei Heng
    Yong Shen
    Jie Xia
    ZiXin Feng
    YunFeng Liu
    Science China Physics, Mechanics and Astronomy, 2013, 56 : 1355 - 1360
  • [23] Large-Signal Network Analysis Including the Baseband
    Pailloncy, Guillaume
    Avolio, Gustavo
    Myslinski, Maciej
    Rolain, Yves
    Bossche, Marc Vanden
    Schreurs, Dominique
    IEEE MICROWAVE MAGAZINE, 2011, 12 (02) : 77 - 86
  • [24] APPROXIMATE LARGE-SIGNAL ANALYSIS OF IMPATT OSCILLATORS
    BLUE, JL
    BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (02): : 383 - +
  • [25] LARGE-SIGNAL ANALYSIS OF SILICON BARITT DIODES
    MATSUMURA, M
    NEC RESEARCH & DEVELOPMENT, 1974, (32): : 1 - 11
  • [26] Analysis and prediction of loudspeaker large-signal symptoms
    HENG Wei
    SHEN Yong
    XIA Jie
    FENG ZiXin
    LIU YunFeng
    Science China(Physics,Mechanics & Astronomy), 2013, (07) : 1355 - 1360
  • [27] Analysis and prediction of loudspeaker large-signal symptoms
    Heng Wei
    Shen Yong
    Xia Jie
    Feng ZiXin
    Liu YunFeng
    SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2013, 56 (07) : 1355 - 1360
  • [28] ANALYSIS OF LARGE-SIGNAL NOISE IN READ OSCILLATORS
    SJOLUND, A
    SOLID-STATE ELECTRONICS, 1972, 15 (09) : 971 - &
  • [29] SMALL AND LARGE-SIGNAL ANALYSIS OF MESFETS AS SWITCHES
    ERON, M
    MICROWAVE JOURNAL, 1992, 35 (01) : 128 - &
  • [30] Measuring the response of a Voltage Controlled Oscillator using the large-signal network analyser
    Rolain, Yves
    Van Moer, Wendy
    Pintelon, Rik
    Schoukens, Johan
    2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 324 - 329
12345