POSITRON LIFETIMES AT VACANCIES IN ELECTRON-IRRADIATED INDIUM-PHOSPHIDE

被引:8
|
作者
TORNQVIST, M
CORBEL, C
LISZKAY, L
SAARINEN, K
HAUTOJARVI, P
机构
[1] CENS,INSTN SEPEM,POSITON LAB,F-91191 GIF SUR YVETTE,FRANCE
[2] HELSINKI UNIV TECHNOL,PHYS LAB,SF-02150 ESPOO,FINLAND
关键词
SEMICONDUCTORS; INDIUM PHOSPHIDE; POSITRONS; DOPING EFFECTS;
D O I
10.1016/0921-5107(94)90030-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report positron lifetime results on electron-irradiated (2.0 MeV at 20 K) Zn-, Fe- and S-doped indium phosphide. In all samples, the average positron lifetime at 300 K increases after irradiation and annealing at 300 K. In electron-irradiated InP(S) (n = 3.9 x 10(18) cm(-3)), a defect identified as the indium vacancy recovers between 150 and 200 K. After annealing at 300 K, another defect lifetime is detected, interpreted as the upper limit for the positron lifetime at the phosphorus vacancy. The phosphorus vacancies remain intact up to annealing temperatures of 300 K.
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页码:126 / 129
页数:4
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