COMBINING CONVERGENT-BEAM DIFFRACTION WITH HIGH-RESOLUTION IMAGING

被引:6
|
作者
OLSEN, A [1 ]
GOODMAN, P [1 ]
机构
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
关键词
D O I
10.1016/0304-3991(81)90049-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:101 / 108
页数:8
相关论文
共 50 条
  • [11] COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING
    COWLEY, JM
    ULTRAMICROSCOPY, 1979, 4 (04) : 435 - 450
  • [12] Interferometry by coherent convergent-beam electron diffraction
    Tsuda, K
    Tanaka, M
    JOURNAL OF ELECTRON MICROSCOPY, 1996, 45 (01) : 59 - 63
  • [13] TECHNIQUES FOR CONVERGENT-BEAM ELECTRON-DIFFRACTION
    DOWELL, WCT
    GOODMAN, P
    JOHNSON, AWS
    WILLIAMS, D
    ULTRAMICROSCOPY, 1980, 5 (01) : 9 - 18
  • [14] CONVERGENT-BEAM DIFFRACTION .1. INTRODUCTION
    EADES, JA
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (01): : 1 - 2
  • [15] High-resolution velocimetry in energetic tidal currents using a convergent-beam acoustic Doppler profiler
    Sellar, Brian
    Harding, Samuel
    Richmond, Marshall
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2015, 26 (08)
  • [16] The past and future of convergent-beam diffraction.
    Eades, JA
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165): : 197 - 198
  • [17] IMPROVEMENT OF RESOLUTION BY CONVERGENT-BEAM ILLUMINATION IN SURFACE PROFILE IMAGES OF HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
    MITOME, M
    TAKAYANAGI, K
    TANISHIRO, Y
    ULTRAMICROSCOPY, 1990, 33 (04) : 255 - 260
  • [18] Imaging defects in two-dimensional crystals by convergent-beam electron diffraction
    Latychevskaia, Tatiana
    Huang, Pengru
    Novoselov, Kostya S.
    Physical Review B, 2022, 105 (18):
  • [19] Imaging defects in two-dimensional crystals by convergent-beam electron diffraction
    Latychevskaia, Tatiana
    Huang, Pengru
    Novoselov, Kostya S.
    PHYSICAL REVIEW B, 2022, 105 (18)
  • [20] APPLICATION OF IMAGING PLATES IN OBSERVING CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
    TSUDA, K
    TANAKA, M
    OIKAWA, T
    JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 279 - 279