TSC MEASUREMENTS OF SODIUM BOROSILICATE GLASS IRRADIATED WITH X-RAYS

被引：0
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作者：
RYSIAKIEWICZPASEK, E
机构：
来源：
JOURNAL OF ELECTROSTATICS | 1989年 / 23卷
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D O I：
10.1016/0304-3886(89)90067-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：391 / 394
页数：4
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