POSSIBILITY OF INVESTIGATING THE INHOMOGENEITY OF SEMICONDUCTOR MATERIALS BY USING PROBE METHODS

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作者：

ORZHEVSKII, OB

FISTUL, VI

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来源：

INDUSTRIAL LABORATORY | 1961年 / 27卷 / 10期

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中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

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页码：1239 / 1242

页数：4

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