SEMICONDUCTOR DETECTORS FOR CHARGED-PARTICLE SPECTROSCOPY IN 80 MEV RANGE

被引：22
|
作者：
RIEPE, G
PROTIC, D
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1972年 / 101卷 / 01期
关键词：
D O I：
10.1016/0029-554X(72)90760-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：77 / +
页数：1
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