ANALYTICAL ELECTRON-MICROSCOPY OF SIC-ALN DIFFUSION COUPLES

被引：0
|
作者：
ZANGVIL, A
RUH, R
机构：
[1] UNIV ILLINOIS,URBANA,IL 61801
[2] USAF,WRIGHT PATTERSON AFB,OH 45433
来源：
AMERICAN CERAMIC SOCIETY BULLETIN | 1981年 / 60卷 / 08期
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：855 / 855
页数：1
相关论文
共 50 条
  • [1] ANALYTICAL ELECTRON-MICROSCOPY OF SIC-A-N DIFFUSION COUPLES
    ZANGVIL, A
    RUH, R
    JOURNAL OF METALS, 1981, 33 (09): : A39 - A39
  • [2] TEM AND ANALYTICAL MICROSCOPY OF MATERIALS IN THE SYSTEM SIC-ALN
    ZANGVIL, A
    RUH, R
    ISHSHALOM, M
    AMERICAN CERAMIC SOCIETY BULLETIN, 1981, 60 (03): : 381 - 381
  • [3] ANALYTICAL ELECTRON-MICROSCOPY AND THE PROBLEM OF POTASSIUM DIFFUSION
    VANDERPLUIJM, BA
    LEE, JH
    PEACOR, DR
    CLAYS AND CLAY MINERALS, 1988, 36 (06) : 498 - 504
  • [4] SiC-AlN particulate composite
    Pan, YB
    Qiu, JH
    Kawagoe, M
    Morita, M
    Tan, SH
    Jiang, DL
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1999, 19 (09) : 1789 - 1793
  • [5] ELECTRON-MICROSCOPY OF ALN-SIC INTERFACES AND SOLID-SOLUTIONS
    BENTLEY, J
    TANAKA, S
    DAVIS, RF
    ELECTRON MICROSCOPY AND ANALYSIS 1993, 1993, (138): : 395 - 398
  • [6] ANALYTICAL ELECTRON-MICROSCOPY
    ZALUZEC, NJ
    AMERICAN LABORATORY, 1981, 13 (04) : 20 - &
  • [7] ANALYTICAL ELECTRON-MICROSCOPY
    RAMACHANDRAN, TR
    BETRABET, HS
    TRANSACTIONS OF THE INDIAN INSTITUTE OF METALS, 1983, 36 (02): : 141 - 161
  • [8] ANALYTICAL ELECTRON-MICROSCOPY
    ZALUZEC, NJ
    INTERNATIONAL LABORATORY, 1981, 11 (07): : 16 - &
  • [9] High preformation SiC-AlN composites
    Chen, ZM
    Tan, SH
    Zhang, ZQ
    Jiang, DL
    JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 1997, 13 (04) : 342 - 344
  • [10] High performance SiC-AlN composites
    Shanghai Inst of Ceramics, Chinese Acad of Sciences, Shanghai, China
    J Mater Sci Technol, 4 (342-344):
12345