INVESTIGATION OF PRECIPITATED COLLOIDAL PARTICLES BY SCANNING FORCE MICROSCOPY - SILVER-HALIDE MICROCRYSTALS

被引：1
|
作者：
SCHWARZ, UD [1 ]
HAEFKE, H [1 ]
机构：
[1] UNIV BASEL, INST PHYS, CH-4056 BASEL, SWITZERLAND
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1994年 / 59卷 / 01期
关键词：
D O I：
10.1007/BF00348417
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Scanning Force Microscopy (SFM) is presented as an alternative to electron microscopy for the investigation of precipitated colloidal particles. The information which can be gained by SFM is illustrated by the example of silver-halide microcrystals with different shapes and sizes. Sample preparation and scan-related problems are discussed extensively from general aspects.
引用
收藏
页码：33 / 40
页数：8
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