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- [2] A UNIT FOR INSPECTING THE PRODUCTION PROCESS OF THIN-LAYER SEMICONDUCTOR AND METALLIC STRUCTURES SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1980, 16 (08): : 559 - 563
- [4] UNIT FOR INSPECTING THE PRODUCTION PROCESS OF THIN-LAYER SEMICONDUCTOR AND METALLIC STRUCTURES. The Soviet journal of nondestructive testing, 1980, 16 (08): : 559 - 563
- [9] Toward a theory of thin-layer lasers Soviet Journal of Quantum Electronics (English translation of Kvantovaya Elektronika), 1992, 22 (10):