A MINIATURIZED SCANNING TUNNELING MICROSCOPE WITH LARGE OPERATION RANGE

被引:13
|
作者
KLEINDIEK, S
HERRMANN, KH
机构
[1] Institüt für Angewandte Physik, D-7400 Tübingen
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 03期
关键词
D O I
10.1063/1.1144199
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A small sized (< 1 cm 3) and low mass (2.5 g) scanning tunneling microscope (STM) with automatized large range tip approach is introduced. By concentric arrangement of two piezotubes a temperature drift compensation is realized. Using a simple likewise concentric glass tube inside the inner piezotube as a frictional wire holder, an unlimited longitudinal adjustment range by stepwise inertial translation could be obtained. High mechanical resonance frequencies due to the low mass as well as the mechanical independency of the environment by purely electronic control reduce remarkably the effort for mechanical damping and make the system fast and particularly suited for special applications such as low temperature STM. Sample change and restoration of the tip position require only a few seconds.
引用
收藏
页码:692 / 693
页数:2
相关论文
共 50 条
  • [1] SCANNING TUNNELING MICROSCOPE WITH LARGE SCAN RANGE
    ADAMCHUK, VK
    ERMAKOV, AV
    FEDOSEENKO, SI
    ULTRAMICROSCOPY, 1992, 42 : 1602 - 1605
  • [2] A SCANNING TUNNELING MICROSCOPE WITH A WIDE SAMPLING RANGE
    HIPPS, KW
    FRIED, G
    FRIED, D
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (07): : 1869 - 1873
  • [3] WIDE-FIELD SCANNING TUNNELING MICROSCOPE FOR OPERATION WITH SCANNING ELECTRON-MICROSCOPE
    VOLODIN, AP
    STEPANYAN, GA
    KHAIKIN, MS
    EDELMAN, VS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 1180 - 1183
  • [4] SURFACE MODIFICATION IN THE NANOMETER RANGE BY THE SCANNING TUNNELING MICROSCOPE
    STAUFER, U
    WIESENDANGER, R
    ENG, L
    ROSENTHALER, L
    HIDBER, HR
    GUNTHERODT, HJ
    GARCIA, N
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 537 - 539
  • [5] Scanning tunneling microscope with long range lateral motion
    Nichols, J.
    Ng, K. -W.
    PHYSICA B-CONDENSED MATTER, 2012, 407 (11) : 1852 - 1854
  • [6] SCANNING TUNNELING MICROSCOPE COMBINED WITH OPTICAL MICROSCOPE FOR LARGE SAMPLE MEASUREMENT
    YASUTAKE, M
    MIYATA, C
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 350 - 353
  • [7] 2 SCANNING TUNNELING MICROSCOPE DEVICES FOR LARGE SAMPLES
    PICOTTO, GB
    DESOGUS, S
    BARBATO, G
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (09): : 2699 - 2701
  • [8] Metrological large range scanning probe microscope
    Dai, GL
    Pohlenz, F
    Danzebrink, HU
    Xu, M
    Hasche, K
    Wilkening, G
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (04): : 962 - 969
  • [9] Active vibration isolation for a long range scanning tunneling microscope
    Lan, KJ
    Yen, JY
    Kramar, JA
    ASIAN JOURNAL OF CONTROL, 2004, 6 (02) : 179 - 186
  • [10] Floating electrometer for scanning tunneling microscope applications in the femtoampere range
    Inst fur Festkorperelektronik und, Mikrostukturzentrum der TU-Wien, Wien, Austria
    Rev Sci Instrum, 12 (4488-4491):