NIST SANDIA ICDD ELECTRON-DIFFRACTION DATABASE - A DATABASE FOR PHASE IDENTIFICATION BY ELECTRON-DIFFRACTION

被引：13

作者：

CARR, MJ

CHAMBERS, WF

MELGAARD, D

HIMES, VL

STALICK, JK

MIGHELL, AD

机构：

[1] J&M SYST, ALBUQUERQUE, NM 87123 USA

[2] NIST, GAITHERSBURG, MD 20899 USA

来源：

关键词：

D O I：

10.6028/jres.094.003

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：15 / 20

页数：6

共 50 条

[1] ELECTRON-DIFFRACTION
YAMAZAKI, Y
[J]. DENKI KAGAKU, 1991, 59 (03): : 186 - 193
[2] THE MODERN SYSTEM OF ELECTRON-DIFFRACTION TECHNIQUES AND ELECTRON-DIFFRACTION ANALYSIS
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[J]. IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1993, 57 (02): : 2 - 7
[3] PRACTICAL PHASE IDENTIFICATION BY CONVERGENT BEAM ELECTRON-DIFFRACTION
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[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (01): : 3 - 15
[4] IDENTIFICATION OF SUBSTANCES BY MEANS OF ELECTRON-DIFFRACTION
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[J]. CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1976, 26 (04): : 386 - 389
[5] METHODS FOR ELECTRON-DIFFRACTION PHASE ANALYSIS
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[J]. ZAVODSKAYA LABORATORIYA, 1972, 38 (04): : 465 - &
[6] RECIPROCITY IN ELECTRON-DIFFRACTION
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[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1992, 48 : 591 - 595
[7] ELECTRON-DIFFRACTION TRANSISTORS
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[J]. PROCEEDINGS : IEEE/CORNELL CONFERENCE ON ADVANCED CONCEPTS IN HIGH SPEED SEMICONDUCTOR DEVICES AND CIRCUITS, 1989, : 246 - 254
[8] PICOSECOND ELECTRON-DIFFRACTION
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[J]. APPLIED PHYSICS LETTERS, 1982, 41 (01) : 44 - 45
[9] ELECTRON-DIFFRACTION ANALYSIS
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[J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 239 - 242
[10] ELECTRON-DIFFRACTION OF CROTOXIN
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[J]. JOURNAL OF SUPRAMOLECULAR STRUCTURE, 1979, : 115 - 115