A TESTING-EFFORT DEPENDENT SOFTWARE-RELIABILITY MODEL AND ITS APPLICATION

被引：15
|
作者：
YAMADA, S
OHTERA, H
NARIHISA, H
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1987年 / 27卷 / 03期
关键词：
D O I：
10.1016/0026-2714(87)90469-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：507 / 522
页数：16
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