STRUCTURE OF AMORPHOUS SILICON TELLURIDE .1. X-RAY-DIFFRACTION INVESTIGATION

被引：10
|
作者：
SCHOENING, FRL
机构：
来源：
JOURNAL OF MATERIALS SCIENCE | 1979年 / 14卷 / 10期
关键词：
D O I：
10.1007/BF00737029
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2397 / 2403
页数：7
相关论文
共 50 条
  • [1] STRUCTURAL INVESTIGATION OF HYDROGENATED AMORPHOUS-SILICON BY X-RAY-DIFFRACTION
    SCHULKE, W
    [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1981, 43 (03): : 451 - 468
  • [2] STRUCTURE OF HIGH-DENSITY AMORPHOUS WATER .1. X-RAY-DIFFRACTION STUDY
    BIZID, A
    BOSIO, L
    DEFRAIN, A
    OUMEZZINE, M
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1987, 87 (04): : 2225 - 2230
  • [3] X-RAY-DIFFRACTION INVESTIGATION ON CHALCOGENIDE AMORPHOUS SUPERLATTICES
    VATEVA, E
    IONOV, R
    NESHEVA, D
    ARSOVA, D
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 128 (01): : K23 - K25
  • [4] STRUCTURE OF LIQUID BROMINE .1. X-RAY-DIFFRACTION STUDY
    NARTEN, AH
    AGRAWAL, R
    SANDLER, SI
    [J]. MOLECULAR PHYSICS, 1978, 35 (04) : 1077 - 1086
  • [5] STRUCTURE OF MOLTEN SILICON AND GERMANIUM BY X-RAY-DIFFRACTION
    WASEDA, Y
    SUZUKI, K
    [J]. ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1975, 20 (04): : 339 - 343
  • [6] STUDIES ON MEASUREMENT OF THE ELASTIC-MODULI OF AMORPHOUS REGION BY X-RAY-DIFFRACTION .1. MEASUREMENT OF THE ELASTIC-MODULI OF AMORPHOUS ATACTIC POLYSTYRENE BY X-RAY-DIFFRACTION
    NAKAMAE, K
    NISHINO, T
    HATA, K
    MATSUMOTO, T
    [J]. KOBUNSHI RONBUNSHU, 1985, 42 (03) : 211 - 217
  • [7] X-ray-diffraction investigation of the anodic oxidation of porous silicon
    Buttard, D
    Bellet, D
    Dolino, G
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) : 8060 - 8070
  • [8] X-RAY-DIFFRACTION AND ENDOR INVESTIGATION OF HYDROGEN-BONDING IN MALONIC-ACID UREA 1-1 ADDUCT .1. X-RAY-DIFFRACTION
    BANDOLI, G
    CLEMENTE, DA
    BRUSTOLON, M
    CORVAJA, C
    PINZINO, C
    COLLIGIANI, A
    [J]. MOLECULAR PHYSICS, 1980, 39 (05) : 1145 - 1152
  • [9] X-RAY-DIFFRACTION STUDY OF THE AMORPHOUS STRUCTURE OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE
    AIYAMA, T
    FUKUNAGA, T
    NIIHARA, K
    HIRAI, T
    SUZUKI, K
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (02) : 131 - 139
  • [10] DOUBLE X-RAY-DIFFRACTION BY AMORPHOUS SUBSTANCE
    MALET, G
    CABOS, C
    ESCANDE, A
    DELORD, P
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (APR1) : 139 - 144
12345