GOODNESS OF FIT TESTS FOR THE MULTIPLE LOGISTIC REGRESSION-MODEL

被引：1363

|

作者：

HOSMER, DW

LEMESHOW, S

机构：

来源：

COMMUNICATIONS IN STATISTICS PART A-THEORY AND METHODS | 1980年 / 9卷 / 10期

关键词：

D O I：

10.1080/03610928008827941

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

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页码：1043 / 1069

页数：27

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