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- [1] SEMIEMPIRICAL CALCULATIONS AND SCANNING PROBE MICROSCOPY STUDIES OF POLYTHIOPHENE THIN-FILMS JOURNAL OF PHYSICAL CHEMISTRY, 1995, 99 (35): : 13213 - 13216
- [2] THE USE OF SCANNING CONDUCTION MICROSCOPY TO PROBE ABRASION OF INSULATING THIN-FILMS REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (07): : 3802 - 3806
- [3] Systematic Quantitative Characterization of Surface Nanostructures by Scanning Probe Microscopy of Thin-Films NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS, 2009, : 285 - 288
- [5] SCANNING FORCE MICROSCOPY OF ORGANIC THIN-FILMS ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 205 : 178 - COLL
- [7] Scanning probe microscopy of organic semiconductor thin films ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245
- [8] Scanning probe microscopy analysis of delaminated thin films PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 576 - 581
- [9] SCANNING SHEARING-STRESS MICROSCOPY OF GOLD THIN-FILMS JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1994, 33 (4A): : L547 - L549
- [10] SCANNING TUNNELING MICROSCOPY STUDIES OF SUBSTITUTED POLYANILINE THIN-FILMS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1452 - 1456