IMPROVEMENT OF RELIABILITY OF GUNN DIODES

被引：5
|
作者：
SHOJI, M
DALESSIO, FJ
机构：
来源：
PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 02期
关键词：
D O I：
10.1109/PROC.1969.6950
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：250 / +
页数：1
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