REFLECTANCE AND ELLIPSOMETRIC STUDY OF ANODIC PASSIVE FILMS FORMED ON NICKEL IN SODIUM-HYDROXIDE SOLUTION

被引：60

作者：

PAIK, WK

SZKLARSKASMIALOWSKA, Z

机构：

来源：

SURFACE SCIENCE | 1980年 / 96卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(80)90316-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：401 / 412

页数：12

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[1] INSITU RAMAN-SPECTROSCOPY OF ANODIC FILMS FORMED ON COPPER AND SILVER IN SODIUM-HYDROXIDE SOLUTION
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[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (04) : 739 - 745
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[J]. THIN SOLID FILMS, 1989, 182 : 185 - 195
[4] ELLIPSOMETRIC DATA OF CADMIUM-OXIDE LAYERS FORMED ANODICALLY IN SODIUM-HYDROXIDE SOLUTIONS
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[5] ANODIC PASSIVATION OF TIN IN SODIUM-HYDROXIDE SOLUTIONS
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[8] Ellipsometric study of anodic oxide films formed on niobium surfaces
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[9] IN SITU RAMAN SPECTROSCOPY OF ANODIC FILMS FORMED ON COPPER AND SILVER IN SODIUM HYDROXIDE SOLUTION.
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