QUANTITATIVE TRACE-ELEMENT ANALYSIS IN THICK SAMPLES WITH HEAVY-ION INDUCED X-RAY-FLUORESCENCE

被引：0
|
作者：
SHABASON, L [1 ]
COHEN, BL [1 ]
WEDBERG, GH [1 ]
CHAN, KC [1 ]
机构：
[1] UNIV PITTSBURGH,PITTSBURGH,PA
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1973年 / 18卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：57 / 57
页数：1
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