COMPARISON OF RELIABILITY - OBJECTIVE AND CONVENTIONAL EXAMINATIONS IN ELECTRONIC ENGINEERING

被引：2

|

作者：

MCVEY, PJ

机构：

来源：

INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION | 1978年 / 15卷 / 02期

关键词：

D O I：

10.1177/002072097801500203

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

引用

收藏

页码：109 / 114

页数：6

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