An Attribute Control Chart under Truncated Life Tests for the Exponentiated Frechet Distribution

被引：0
|
作者：
Rosaiah, K. [1 ]
Rao, G. Srinivasa [2 ]
Babu, M. Sridhar [1 ]
机构：
[1] Acharya Nagarjuna Univ, Dept Stat, Guntur 522007, India
[2] Univ Dodoma, Dept Stat, Dodoma, Tanzania
来源：
QUALITY-ACCESS TO SUCCESS | 2018年 / 19卷 / 163期
关键词：
exponentiated Frechet distribution; attribute control chart; life test; average run length;
D O I：
暂无
中图分类号：
C93 [管理学];
学科分类号：
12 ; 1201 ; 1202 ; 120202 ;
摘要：
Assuming that the lifetime of the product follows exponentiated Frechet distribution (EFD), an attribute control chart is proposed under time truncated life test with known shape parameter. The performance evaluation of the proposed control chart is discussed using the average run length (ARL). The fables are presented for various values of shape parameters, sample size, specified ARL and shift constants. A simulation study is given to demonstrate the performance of the proposed control chart for monitoring of non-conforming items in the industries.
引用
收藏
页码：47 / 51
页数：5
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