APPARATUS FOR MEASUREMENT OF HALL-EFFECT IN SEMICONDUCTORS AT HIGH-TEMPERATURES

被引：1

作者：

HALES, MC ^{[1
]}

KNIGHT, JR ^{[1
]}

机构：

[1] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 06期

关键词：

D O I：

10.1088/0022-3735/6/6/009

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：520 / 521

页数：2

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