DEVICE FOR CONTACTLESS LOCAL DETERMINATION OF FREE-CARRIER MOBILITY IN SEMICONDUCTORS

被引：0

作者：

MEDVEDEV, YV

PETROV, AS

SKRYLNIKOV, AA

机构：

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1988年 / 31卷 / 01期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

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引用

页码：219 / 221

页数：3

共 50 条

[1] CONTACTLESS DETERMINATION OF FREE CARRIER DENSITY AND MOBILITY IN SEMICONDUCTORS
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[7] IR POLARIMETERS AND QUESTIONS OF METHOD RELATING TO CONTACTLESS MEASUREMENT OF FREE-CARRIER CONCENTRATIONS IN SEMICONDUCTORS
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[8] FREE-CARRIER VOIGT EFFECT IN SEMICONDUCTORS
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[9] DETERMINATION OF THE CARRIER MOBILITY AND DENSITY IN SEMICONDUCTORS BY CONTACTLESS MAGNETOPLASMA METHODS.
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[10] Collective free-carrier scattering in semiconductors
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