INVESTIGATION OF MICRODEFECTS IN HIGH-PURITY SILICON CRYSTALS BY MEANS OF LITHIUM DECORATION

被引：0
|
作者：
KOCK, AJRD [1 ]
BOONEN, PGT [1 ]
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源：
JOURNAL OF APPLIED PHYSICS | 1973年 / 44卷 / 06期
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D O I：
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中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：2816 / 2828
页数：13
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