SECONDARY ION MASS-SPECTROMETRY AS A MEANS OF SURFACE-ANALYSIS

被引：114

|

作者：

WITTMAACK, K

机构：

来源：

SURFACE SCIENCE | 1979年 / 89卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(79)90648-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

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页码：668 / 700

页数：33

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