SHORT-PERIOD CDTE(ZNTE)/MNTE SUPERLATTICES - GROWTH AND CHARACTERIZATION

被引：12

作者：

ABRAMOF, E

FASCHINGER, W

SITTER, H

PESEK, A

机构：

[1] UNIV LINZ,OPTOELECTR FORSCHUNGSINST,A-4040 LINZ,AUSTRIA

[2] INST PESQUISAS ESPACIAIS,BR-12201 ST DOS CAMPOS,SP,BRAZIL

来源：

JOURNAL OF CRYSTAL GROWTH | 1994年 / 135卷 / 3-4期

关键词：

D O I：

10.1016/0022-0248(94)90133-3

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

We report on the growth of CdTe/MnTe and ZnTe/MnTe short-period superlattices. The CdTe and ZnTe layers have been grown by atomic layer epitaxy technique, and a quadrupole mass spectrometer controlled molecular beam epitaxy has been used for the MnTe layers growth. The critical thickness of MnTe on both CdTe and ZnTe layers has been determined by reflected high energy electron diffraction experiments and the structure of the superlattices was studied by X-ray diffraction analysis.

引用

页码：447 / 454

页数：8

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[1] SHORT-PERIOD CDTE-ZNTE AND CDTE-MNTE SUPERLATTICES
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[9] High resolution x-ray diffraction studies of short-period CdTe/MnTe superlattices
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