MEASUREMENT OF THE THERMAL-DIFFUSIVITY OF THIN-FILMS WITH BOLOMETERS AND WITH PYROELECTRIC TEMPERATURE SENSORS

被引:17
|
作者
PLOSS, B [1 ]
BAUER, S [1 ]
BON, C [1 ]
机构
[1] UNIV JOSEPH FOURIER,GRENOBLE,FRANCE
关键词
D O I
10.1080/00150199108014776
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Several methods for the measurement of the thermal diffusivity of thin films are developed. Common to all methods is the generation of a thermal wave via the absorption of intensity-modulated light on one surface of the film; resistive thin film bolometers and pyroelectric sensors are used for the temperature recording. For free-bearing films the thermal diffusivity is determined from front and rear side temperature spectra as a function of the modulation frequency, measured with resistive bolometers. If a pyroelectric material is mounted on a heat sink, the thermal diffusivity is obtained from the spectrum of the pyroelectric current. For very thin films pyroelectric substrates are recommended as temperature sensors. A novel method is also proposed, in which the thermal diffusivity is obtained without the influence of any other material properties and any sensor characteristics. Experimental results are presented with a 25 μm thick PVDF film and with a 1.25 μm thick Polyglutamate Langmuir-Blodgett film on a 9 μn thick PVDF substrate. The thermal diffusivity for the PVDF films is D = 6.2 x 10-8 m-/s and for the Polyglutamate Langmuir-Blodgett film D = 5.5 x 10-8 m2/s at room temperature. The techniques are theoretically discussed and various methods for the analysis of measured data are introduced. © 1991, Taylor & Francis Group, LLC. All rights reserved.
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页码:435 / 450
页数:16
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