DEFECT STRUCTURE-ANALYSIS OF THICK EPITAXIAL-FILMS WITH VERY LARGE LATTICE MISMATCH - AG/SI(111) AND AG/SI(001)

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作者：
PARK, KH
SMITH, GA
MCKENNA, DC
LUO, L
JIN, HS
GIBSON, WM
RAJAN, K
LU, TM
WANG, GC
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CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS | 1989年 / 138卷
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T [工业技术];
学科分类号：
08 ;
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页码：545 / 550
页数：6
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