STRUCTURAL STUDIES OF TETRATHIAFULVALENE-TETRACYANOQUINODIMETHANE THIN-FILMS BY SCANNING-TUNNELING-MICROSCOPY

被引：9
|
作者：
ARA, N
KAWAZU, A
SHIGEKAWA, H
YASE, K
YOSHIMURA, M
机构：
[1] UNIV TOKYO,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN
[2] UNIV TSUKUBA,INST MAT SCI,TSUKUBA,IBARAKI 305,JAPAN
[3] NATL INST MAT & CHEM RES,DEPT POLYMER PHYS,TSUKUBA,IBARAKI 305,JAPAN
[4] HIROSHIMA UNIV,DEPT ELECT ENGN,HIGASHIHIROSHIMA 724,JAPAN
来源：
APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 24期
关键词：
D O I：
10.1063/1.113403
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Thin films of tetrathiafulvanene-tetracyanoquinodimethane (TTF-TCNQ) grown on mica substrates by vacuum deposition were studied by scanning tunneling microscopy (STM). STM images displayed the usual arrangement of alternative TTF and TCNQ columns aligned parallel to the crystal b axis. However, in addition to the same phase as that of a TTF-TCNQ bulk crystal, a new phase is observed. In this new phase the tilt angles the TCNQ and TTF molecular planes make with the a×b axis are different from those observed in the normal phase. This new phase can be explained by the introduction of a stacking fault on the surface.© 1995 American Institute of Physics.
引用
收藏
页码：3278 / 3280
页数：3
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