ION-BEAM MIXING OF TIC/FE BILAYERS

被引：0
|
作者：
GESAN, P
DELAFOND, J
CAHOREAU, M
EYMERY, JP
GAREM, H
机构：
[1] Laboratoire de Métallurgie Physique, UR4 131 CNRS, Université de Poitiers
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 80-1卷
关键词：
D O I：
10.1016/0168-583X(93)96147-5
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
TiC/Fe bilayers deposited by ion beam sputtering have been irradiated with 340 keV Xe2+ ions up to 10(16) ions cm-2 at LN2 temperature. The samples have been analysed by means of secondary ion mass spectroscopy (SIMS) and transmission electron microscopy (TEM) on cross-sectioned samples. An intermediate layer with an amorphous structure at the interface was observed after irradiation. The mixing efficiency of titanium is lower than that of carbon. The titanium mixing variance displays a linear relationship with fluence, while the carbon mixing variance does not scale linearly with fluence.
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收藏
页码：394 / 397
页数：4
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