SPHERICAL WAVE EXAFS ANALYSIS OF THE SILICON K-EDGE X-RAY ABSORPTION-SPECTRUM

被引：14
|
作者：
DICICCO, A [1 ]
BIANCONI, A [1 ]
PAVEL, NV [1 ]
机构：
[1] UNIV ROME LA SAPIENZA,DEPARTIMENTO CHIM,I-00185 ROME,ITALY
来源：
SOLID STATE COMMUNICATIONS | 1987年 / 61卷 / 10期
关键词：
D O I：
10.1016/0038-1098(87)90377-2
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：635 / 639
页数：5
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