MEASUREMENT OF IONIZATION RATES IN DIFFUSED SILICON P-N JUNCTIONS

被引：599

|

作者：

VANOVERSTRAETEN, R

DEMAN, H

机构：

来源：

SOLID-STATE ELECTRONICS | 1970年 / 13卷 / 05期

关键词：

D O I：

10.1016/0038-1101(70)90139-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：583 / +

页数：1

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