OPTIMUM INSPECTION-ORDERING POLICIES WITH SALVAGE COST

被引：12

|

作者：

KAIO, N

OSAKI, S

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1978年 / 18卷 / 03期

关键词：

D O I：

10.1016/0026-2714(78)90329-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：253 / 257

页数：5

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