SURFACE-STRUCTURE FROM ANGLE-RESOLVED SECONDARY-ION MASS-SPECTROMETRY - OXYGEN ON CU(001)

被引:104
|
作者
HOLLAND, SP
GARRISON, BJ
WINOGRAD, N
机构
关键词
D O I
10.1103/PhysRevLett.43.220
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:220 / 223
页数:4
相关论文
共 50 条
  • [1] ANGLE-RESOLVED SECONDARY ION MASS-SPECTROMETRY
    WINOGRAD, N
    ACS SYMPOSIUM SERIES, 1985, 291 : 83 - 96
  • [2] ANGLE-RESOLVED MASS-SPECTROMETRY
    KINGSTON, EE
    BRENTON, AG
    BOYD, RK
    BEYNON, JH
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 47 (JAN): : 117 - 120
  • [3] ANGLE-RESOLVED MASS-SPECTROMETRY
    LARAMEE, JA
    CARMODY, JJ
    COOKS, RG
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 31 (04): : 333 - 343
  • [4] GAAS(001)(2X4) SURFACE-STRUCTURE STUDIES WITH SHADOW-CONE-ENHANCED SECONDARY-ION MASS-SPECTROMETRY
    XU, C
    CAFFEY, KP
    BURNHAM, JS
    GOSS, SH
    GARRISON, BJ
    WINOGRAD, N
    PHYSICAL REVIEW B, 1992, 45 (12): : 6776 - 6785
  • [5] SECONDARY-ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    CHEMIE IN UNSERER ZEIT, 1994, 28 (05) : 222 - 232
  • [6] SECONDARY-ION MASS-SPECTROMETRY
    ZALM, PC
    VACUUM, 1994, 45 (6-7) : 753 - 772
  • [7] THE INFLUENCE OF OXYGEN ON THE ANALYSIS OF A PT/SI STRUCTURE WITH SECONDARY-ION MASS-SPECTROMETRY
    ELST, K
    VANDERVORST, W
    JOURNAL OF APPLIED PHYSICS, 1993, 73 (09) : 4649 - 4659
  • [8] SECONDARY-ION MASS-SPECTROMETRY AND GEOLOGY
    MACRAE, ND
    CANADIAN MINERALOGIST, 1995, 33 : 219 - 236
  • [9] SECONDARY-ION MASS-SPECTROMETRY - FOREWORD
    BENTZ, BL
    ODOM, RW
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1995, 143 : R9 - R9
  • [10] SECONDARY-ION MASS-SPECTROMETRY IMAGING
    ODOM, RW
    APPLIED SPECTROSCOPY REVIEWS, 1994, 29 (01) : 67 - 116