Novel SAT-Based Peak Dynamic Power Estimation for Digital Circuits

被引:2
|
作者
Shyamala, K. [1 ]
Vimalkumar, J. [1 ]
Kamakoti, V. [1 ]
机构
[1] Indian Inst Technol Madras, Dept Comp Sci & Engn, RISE Lab, Chennai 600036, Tamil Nadu, India
关键词
Automatic Test Pattern Generation (ATPG); Boolean Satisfiability (SAT); Field Programmable Gate Arrays (FPGA); Gate-Level Netlists; Maximum Boolean Satisfiability (MaxSAT); Lookup Table (LUT); Logic Synthesis; Partial Weighted MaxSAT; Peak Dynamic Power Estimation (PDPE);
D O I
10.1166/jolpe.2009.1042
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Estimation of Peak Dynamic Power (proportional to the switching activity) of digital circuits early in the design flow is crucial to realize a reliable and power-efficient chip. This paper presents a novel satisfiability based formulation to estimate the Peak Dynamic Power on gate-level as well as Lookup-table-level (targeted for FPGAs) netlists. Experimentation with the ISCAS' 85 gate-level benchmark circuits shows that the best and the average estimates of switching activity computed by the proposed approach are 10% and 5% respectively more than the best reported in the literature. Similarly, for LUT-level netlists of ISCAS' 85 benchmark circuits, the best and the average estimates of switching activity computed by the proposed approach are 69.83% and 50% respectively more than the best reported in the literature. Interestingly, for some of the circuits the SAT solver does provide a global optimal solution. The paper also provides empirical insights into the limitations of Automatic Test Pattern Generation-based approaches for peak dynamic power estimation.
引用
收藏
页码:429 / 438
页数:10
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