CHARACTERIZATION BY X-RAY-DIFFRACTION, ELECTRON-MICROSCOPY AND X-RAY-FLUORESCENCE OF THIN-FILMS OBTAINED FROM EVAPORATION OF SMS - CRYSTALLOGRAPHIC STRUCTURES AFTER ANNEALING WITH THE ELECTRON-BEAM

被引：1
|
作者：
GASGNIER, M [1 ]
SENATEUR, JP [1 ]
机构：
[1] ECOLE NATL SUPER INGN ELECT GRENOBLE,MAT LAB,EQUIPE RECH 155,F-38042 ST MARTIN DHERES,FRANCE
来源：
JOURNAL DE PHYSIQUE | 1980年 / 41卷 / 10期
关键词：
D O I：
10.1051/jphys:0198000410100112700
中图分类号：
学科分类号：
摘要：
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页码：1127 / 1133
页数：7
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