BEST LINEAR UNBIASED ESTIMATION FOR THE WEIBULL PROCESS

被引：0
|
作者：
HARTLER, G
机构：
[1] Akademie der Wissenschaften der DDR, Zentral Institut fur Elektronen-physik, 1086 Berlin
来源：
MICROELECTRONICS AND RELIABILITY | 1994年 / 34卷 / 07期
关键词：
D O I：
10.1016/0026-2714(94)90511-8
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Best linear unbiased estimators, approximative simultaneous confidence limits, acceptance regions, and prediction limits are given for the Weibull process. The approach is based on failure terminated observations, the statistic generalized total life, and the logarithmic gamma distribution. The procedure allows one to process failure data for n greater-than-or-equal-to 1 simultaneously observed repairable systems with censored observations. The results are compared with inference based on maximum likelihood.
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页码：1253 / 1260
页数：8
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