SPECIAL ISSUE ON RELIABILITY - FOREWORD

被引：0

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作者：

KASPRZAK, LA

HU, CM

TAKEDA, E

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1988年 / 35卷 / 12期

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：2086 / 2087

页数：2

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