Transistor Fault Diagnostic Methods in the AC/DC Line-Side Converter

In this article two transistor fault diagnostic algorithms in the AC/DC line-side converter with a bidirectional power flow are compared. The presented methods allow to a fast transistor open-circuit fault detection and they can be used with no additional hardware in various control structures. As opposed to known from a literature survey similar methods, an effectiveness of the proposed algorithms has been verified under a rectifying as well as generation mode of the converter. In the article, the chosen simulation and experimental results that prove the full effectiveness of the proposed methods have been presented.