HIGH-PERFORMANCE OPTICAL SPECTROSCOPE FOR CATHODOLUMINESCENCE IN SCANNING ELECTRON-MICROSCOPY

被引：0

|

作者：

SEMO, J

机构：

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：69 / 70

页数：2

相关论文

共 50 条

[1] OPTICAL SPECTROSCOPY IN CATHODOLUMINESCENCE BY SCANNING ELECTRON-MICROSCOPY
SEMO, J
[J]. REVUE DE PHYSIQUE APPLIQUEE, 1974, 9 (02): : 355 - 359
[2] CATHODOLUMINESCENCE SCANNING ELECTRON-MICROSCOPY OF SEMICONDUCTORS
YACOBI, BG
HOLT, DB
[J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (04) : R1 - R24
[3] NEW DIRECTIONS IN SCANNING ELECTRON-MICROSCOPY CATHODOLUMINESCENCE MICROCHARACTERIZATION
HOLT, DB
[J]. SCANNING MICROSCOPY, 1992, 6 (01) : 1 - 21
[4] POLARIZATION CONTRAST OF CATHODOLUMINESCENCE, OBSERVED IN SCANNING ELECTRON-MICROSCOPY
SPIVAK, GV
FILIPPOV, MN
ANTOSHIN, MK
[J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1977, 41 (05): : 876 - 879
[5] TIME-RESOLVED CATHODOLUMINESCENCE IN SCANNING ELECTRON-MICROSCOPY
HASTENRATH, M
KUBALEK, E
[J]. SCANNING ELECTRON MICROSCOPY, 1982, : 157 - 173
[6] IMPROVED SPECTROMETER FOR CATHODOLUMINESCENCE STUDIES IN SCANNING ELECTRON-MICROSCOPY
BEAUVINEAU, J
SEMO, J
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (10): : 1573 - 1576
[7] HIGH-PERFORMANCE CRYO TRANSMISSION ELECTRON-MICROSCOPY
HEZEL, UB
ZELLMANN, E
HOFFMEISTER, D
[J]. ULTRAMICROSCOPY, 1985, 17 (02) : 174 - 174
[8] CATHODOLUMINESCENCE SCANNING ELECTRON-MICROSCOPY IN THE STUDY OF SILICATE ROCK MICROSTRUCTURE
BEHR, HJ
FRENTZELBEYME, K
[J]. FORTSCHRITTE DER MINERALOGIE, 1987, 65 : 18 - 18
[9] SPATIAL-RESOLUTION OF CATHODOLUMINESCENCE SCANNING ELECTRON-MICROSCOPY OF SEMICONDUCTORS
PETROV, VI
GVOZDOVER, RS
[J]. SCANNING, 1991, 13 (06) : 410 - 414
[10] SCANNING ELECTRON-MICROSCOPY - IDENTIFICATION OF MAST-CELLS BY INDIRECT CATHODOLUMINESCENCE
PADAWER, J
[J]. HISTOCHEMISTRY, 1974, 38 (04) : 351 - 360

← 1 2 3 4 5 →