HIGH-INTENSITY APPARATUS FOR ACCURATE COMPTON PROFILE MEASUREMENTS

被引：0
|
作者：
MANNINEN, S [1 ]
PAAKKARI, T [1 ]
机构：
[1] UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1978年 / 34卷
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D O I：
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：S32 / S32
页数：1
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