ATOMIC-FORCE MICROSCOPY STUDY OF CUBIC AND OCTAHEDRAL AGBR MICROCRYSTALS

被引：0

作者：

SCHWARZ, UD ^{[1
]}

HAEFKE, H ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

BOHONEK, J ^{[1
]}

STEIGER, R ^{[1
]}

机构：

[1] ILFORD AG,CH-1700 FRIBOURG,SWITZERLAND

来源：

JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY | 1993年 / 37卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TB8 [摄影技术];

学科分类号：

0804 ;

摘要：

Atomic force microscopy (AFM) has been used to study monodisperse cubic and octahedral AgBr microcrystals, which are essential components of modem photographic materials. Using AFM, detailed information about shape and surface morphology of these microcrystals can be obtained directly with high lateral, as well as vertical, resolution. Critical emulsion parameters, such as diameter, height, and surface roughness, have been determined for individual microcrystals. The results are discussed with regard to principal questions related to AFM measurements on precipitated emulsion particles.

引用

页码：344 / 347

页数：4

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